R. Rykowski and C. B. Wooley, “Source Modeling for Illumination Design”, 1997 SPIE Conference, San Diego, CA 

I. Ashdown and R. Rykowski, “Making Near-Field PhotometryvPractical,” 1997 IESNA Annual Conference, Seattle, WA 

D. R. Jenkins and H. Monch, “Source Imaging Goniometer Method of Light Source Characterization for Accurate Projection System Design”, 2000 SID Digest, pp 862-865, 

W. J. Cassarly, D. R. Jenkins, H. Monch, “Accurate Illumination System Predictions Using Measured Spatial Luminance Distributions,” SPIE Proceedings, Vol. 4774, 2002.

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